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STDF Viewer is a free, fast and powerful GUI tool to visualize STDF (semiconductor Standard Test Data Format) data files.
Devloped by Noon Chen 
## Table of Content
- [**Usage**](#usage)
- [Open a STDF file](#open-a-stdf-file)
- [Find failed test items](#find-failed-test-items)
- [Looking for DUTs' info](#looking-for-duts-info)
- [Display GDRs & DTRs info](#display-gdrs--dtrs-info)
- [Analyzing test data](#analyzing-test-data)
- [Test data](#test-data)
- [Trend chart](#trend-chart)
- [Histogram](#histogram)
- [Analyzing bin distribution](#analyzing-bin-distribution)
- [Viewing wafer maps](#viewing-wafer-maps)
- [Read complete test data of specific DUTs](#read-complete-test-data-of-specific-duts)
- [From `DUT Summary`](#from-dut-summary)
- [From `Test Summary`](#from-test-summary)
- [From `Trend Chart`](#from-trend-chart)
- [From `Histogram`](#from-histogram)
- [From `Bin Summary`](#from-bin-summary)
- [From `Wafer Map`](#from-wafer-map)
- [Generating an Excel report](#generating-an-excel-report)
- [Settings](#settings)
- [Change fonts](#change-fonts)
- [**Having issues?**](#having-issues)
- [**Acknowledgements**](#acknowledgements)
- [**License**](#license)
- [**Download**](#download)
- [**Contributions**](#contributions)
## Usage
### **Open a STDF file**
STDF Viewer supports files under [STDF Version 4 Specification](http://www.kanwoda.com/wp-content/uploads/2015/05/std-spec.pdf), ZIP*, GZ and BZIP compressed STDF files can also be opened without decompression.
STDF files can be opened in 3 ways:
1. Select a STDF file in a file dialog by clicking `open` button on the toolbar.
2. Right click on a STDF file and select STDF Viewer to open.
3. Drag a STDF file into the GUI to open.
***Note**: ZIP format support is limited, works only if:*
- *ZIP file is not password protected.*
- *Contains only 1 file per ZIP.*
- *ZIP file is created using `DEFLATE` compression method, which is the default on popular OSs' native zip tool.*
### **Find failed test items** By clicking the `Fail Marker` button on the toolbar can paint all failed test items in red, if the `Find Low Cpk` is enabled in `Settings`, test items with Cpk lower than the threshold (can be set in `Settings`) will be painted in orange.
### **Looking for DUTs' info** DUTs' info can be viewed in `Detailed Info` -> `DUT Summary`. Each line in the table represents a single DUT, and it will be marked in red if this DUT is failed.
If STDF files contain multiple heads and/or sites, you may also filter out the DUTs of non-interest by selecting specific heads and/or sites in `Site/Head Selection`.
DUTs' info can be sorted by any columns. For instance, the screenshot below showing the result of sorting the DUTs by flags.
### **Display GDRs & DTRs info** All the GDR (Generic Data Record) and DTR (Datalog Text Record) will be listed in `Detailed Info` -> `GDR & DTR Summary`. The precise location of GDR & DTR is hard to trace, the relative location compared to PIR/PRR is given instead. For GDR, each line in the `Value` column represents a V1 data, which is displayed in the format of `{V1 index} {V1 data type}: {V1 data}`. *Note: Data of `Bn` & `Dn` type is shown in HEX string.*
### **Analyzing test data** ***Importance Notice**: Functional Tests (FTR) have no test value, instead, the test flag is used as the test value for drawing trend charts and histograms* All test items in the STDF file will be shown in the `Test Selection`, in which you can select single or multiple test item(s). The search box below can help you find test item(s) more easily. Statistic (Cpk, mean, std dev, etc.) of the test items in the selected heads and sites is displayed in `Test Statistics`. #### **Test data** Select test item(s) and then navigate to `Detailed Info` -> `Test Summary`. Each row is a DUT that's been tested in the selected heads and sites, data of selected tests will be appended to the rightmost column.
#### **Trend chart**
Display interactive trend charts of test item(s), y axis is the value of the test item, x axis is the index of DUTs that's been tested in selected head and site. You can hover over the point to show more information.
If the test have PAT enabled, e.g. high/low limits in PTRs are changing over duts, the dynamic limits will be shown instead.
#### **Histogram**
Display interactive histograms of test item(s), x axis is the test value distribution, y axis is the DUT counts of each bin. you can hover over the rectangle to display its data range and dut counts.
### **Analyzing bin distribution** Display histograms of dut counts of each hardware bin and software bin in selected heads and sites. `Test Statistic` table displays the bin name, bin number and precentage, bins with DUT counts of 0 will be hidden.
### **Viewing wafer maps** If STDF files contain wafer information (WCR, WIR, WRR records), the `Wafer Map` tab will be enabled. There is a stacked wafer map at the top of `Wafer Selection` that summarizes the total count of fail dut in each (X, Y) coordinates of all wafermaps in the current file.
Other entries in `Wafer Selection` represents the wafer maps in the file, color of each die is determined by its software bin.
### **Read complete test data of specific DUTs** In some cases, it would be helpful to see the detailed test results of some DUTs, as shown below. It can be achieved by several methods in the STDF Viewer.
#### **From `DUT Summary`**
Select row(s) of interest and right click, click `Read selected DUT data` in the context menu.
#### **From `Test Summary`**
Select cell(s) of interest and right click, click `Read selected DUT data` in the context menu.
#### **From `Trend Chart`**
Click on the data point (or press `Shift` to select multiple), when the point(s) are marked by *`S`*, press `Enter` on the keyboard.
#### **From `Histogram`**
Click on the histogram rectangle (or press `Shift` to select multiple), selected rectangles will be marked in red stroke, press `Enter` will list all duts whose test values lie in select range(s).
#### **From `Bin Summary`**
Click on the bins of interest (or press `Shift` to select multiple), press `Enter` will show all duts in these bins.
#### **From `Wafer Map`**
Click on the die(s), press `Enter` will show you duts in the selected (X, Y).
### **Generating an Excel report** Almost all information displayed on STDF Viewer can be exported to a Excel report.
Each checkbox in `Report Content Selection` will be saved in a individual sheet in the report.
- `File Info`: File properties, MIR, MRR, ATR, RDR and SDR inifo.
- `DUT Summary`: Content in DUT Summary table, test data will be added if test items are selected.
- `Trend Chart`: Trend Plot + Statistics.
- `Histogram`: Histogram Plot + Statistics.
- `Bin Chart`: Bin Plot + bin summary.
- `Wafer Map`: All Wafermap Plots.
- `Test Statistics`: Statistics of all selected test items.
- `GDR & DTR Summary`: All GDR and DTR info.
The numbers of figures/data in the report are based on numbers of tests in `Export Tests` and selected Heads and Sites.
### **Settings** STDF Viewer offers a global setting UI, which can change the appearance of figures, colors of each sites/bins, etc. in STDF Viewer or the exported report. The description should be self-explanatory, feel free to play it around.
#### **Change fonts**
Users can change the default fonts for UI display and data plots.
Rename a TrueType Font (.ttf) file to apply the font for a certain language:
- Chinese: prefix `cn_`
- English: prefix `en_`
For example, we want to use a font file named `testfontforchinese.ttf` as the default Chinese font, it should be renamed to `cn_testfontforchinese.ttf`, it will be the default font for Chinese language, other languages will not be affected.
Copy the renamed font file to `/fonts` folder, it is located at:
- Windows: next to the `.EXE`
- macOS: `STDF Viewer.app/Contents/Resources/fonts`
- Ubuntu: `/usr/local/bin/STDF-Viewer/fonts`
Relaunch STDF Viewer to apply the changes.
## Having issues? If you have encountered any error, follow these steps to create a report: 1. Open STDF-Viewer and click `About` in the top-right corner.
2. Click `debug` button to show the debug panel.
3. Click `Display Log File` to print all the error logs on the screen; If the error is file-related, click `STDF Record Type Reader` and select the file that triggers the error.
4. Click `Save Result` and create an issue on github.
## Acknowledgements
STDF Viewer uses code from the following open sources, much thanks to their authors.
- [zlib](https://zlib.net/)
- [minizip](https://www.winimage.com/zLibDll/minizip.html)
- [bzip2](https://www.sourceware.org/bzip2/)
- [sqlite3](https://www.sqlite.org/)
- [hashmap](https://gist.github.com/warmwaffles/6fb6786be7c86ed51fce)
- [message_queue](https://github.com/LnxPrgr3/message_queue)
Not used in version 3.0.5 and above:
- ~~[pystdf](https://github.com/cmars/pystdf)~~
## License STDF Viewer is licensed under GPL V3.0, which means the software is free but I don't take any responsibilites if anything goes wrong due to the usage of the STDF Viewer, it is always safe to be skeptical about the results or images on the STDF Viewer. The icons that I designed for STDF Viewer is licensed under [Attribution-NonCommercial 4.0 (CC BY-NC 4.0)](https://creativecommons.org/licenses/by-nc/4.0/).
## Download [Click here](https://github.com/noonchen/STDF-Viewer/releases)
## Contributions Pull requests and bug reports are always welcomed.